Preface and Conference Photo
Methods of Electron Crystallography as Tools for Materials Analysis
p.1
p.1
Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films
p.7
p.7
Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science
p.13
p.13
The Art and Application of Large Angle Convergent Beam Electron Diffraction
p.16
p.16
Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM
p.20
p.20
Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM
p.24
p.24
A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food Supplements
p.28
p.28
Physical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy
p.32
p.32
The Art and Application of Large Angle Convergent Beam Electron Diffraction
Abstract:
The antiphase domain structure in Ni3Al and Al3Ti+Cu intermetallic alloys was recognized by conventional transmission electron microscopy and large angle convergent beam electron diffraction methods. In the case of antiphase boundary the superlattice excess line is split into two lines with equal intensity on bright and dark field LACBED pattern. This splitting can be considered as typical and used to identify APBs. The recognition between perfect structure of the defect-free matrix and the screw deviation around the nanopipes in GaN epilayers was performed with high accuracy using Zone Axis LACBED images.
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Info:
Periodical:
Solid State Phenomena (Volume 186)
Pages:
16-19
Citation:
Online since:
March 2012
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