Evaluation of Residual Stresses at the Interface with Implant by Synchrotron Radiation

Abdelilah Benmarouane; Hélène Citterio; Pierre Millet; Thomas Buslaps; Alain Lodini

doi:10.4028/www.scientific.net/MSF.772.135

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HomeMaterials Science ForumMaterials Science Forum Vol. 772Evaluation of Residual Stresses at the Interface...

Evaluation of Residual Stresses at the Interface with Implant by Synchrotron Radiation

Abstract:

The aim of the present study was to study the interface implant-bone by synchrotron radiation, the implant has two faces the first one coated with hydroxyapatite and the second uncoated. In orthopaedic surgery, Titanium (Ti-Al-4V) implants are currently coated with hydroxyapatite (HAp), Ca10 (PO4)6 (OH)2, in order to obtain a stable and functional direct connection between the bone and the implant. At the implant-bone interface, the new bone reconstituted after two months of implantation must have the same properties like the natural bone in order to accept the implant. Therefore we studied the residuals stresses and texture of the new bone crystals reconstituted at the interface using synchrotron radiation on ID15 at ESRF in Grenoble, France.

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Periodical:

Materials Science Forum (Volume 772)

Pages:

135-139

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.772.135

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Online since:

November 2013

Authors:

Abdelilah Benmarouane, Hélène Citterio, Pierre Millet, Thomas Buslaps, Alain Lodini

Keywords:

Bone, Hydroxyapatite (HAP), Residual Stress, Synchrotron Radiation, Texture, Ti6Al4V

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