Numerical Study of Current Crowding Phenomenon in Complementary 4H-SiC JBS Rectifiers
p.1045
p.1045
Influence of H2 Pre-Treatment on Ni/4H-SiC Schottky Diode Properties
p.1049
p.1049
The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes
p.1053
p.1053
High-Quality 3C-SiC pn-Structures Created by Sublimation Epitaxy on a 6H-SiC Substrate
p.1057
p.1057
High Breakdown Field p-Type 3C-SiC Schottky Diodes Grown on Step-Free 4H-SiC Mesas
p.1061
p.1061
Electrical Properties of pn Diodes on 4H-SiC(000-1) C-Face and (11-20) Face
p.1065
p.1065
Avalanche Multiplication and Breakdown in 4H-SiC Diodes
p.1069
p.1069
Investigation of Rapid Thermal Annealed pn-Junctions in SiC
p.1073
p.1073
Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC
p.1077
p.1077
High Breakdown Field p-Type 3C-SiC Schottky Diodes Grown on Step-Free 4H-SiC Mesas
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 457-460)
Pages:
1061-1064
Citation:
Online since:
June 2004
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