OBIC Measurements of 1.3kV 6H-SiC Bipolar Diodes Protected by Junction Termination Extension
p.863
p.863
4H-SiC pn Diode Grown by LPE Method for High-Power Applications
p.867
p.867
Characterization of a 4H-SiC High Power Density Controlled Current Limiter
p.871
p.871
Forward Dynamic IV Characteristics in Epitaxial and Implanted SiC PiN Power Diodes
p.875
p.875
Fabrication and Simulation of 4H-SiC PiN Diodes Having Mesa Guard Ring Edge Termination
p.879
p.879
Fabrication and Characterisation of High-Voltage SiC-Thyristors
p.883
p.883
SiC Device Limitation Breakthrough with Novel Floating Junction Structure on 4H-SiC
p.887
p.887
Novel Buried Field Rings Edge Termination for 4H-SiC High-Voltage Devices
p.891
p.891
To Be ''Snappy'' or Not - a Comparison of the Transient Behaviours of Bipolar SiC-Diodes
p.895
p.895
Fabrication and Simulation of 4H-SiC PiN Diodes Having Mesa Guard Ring Edge Termination
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 433-436)
Pages:
879-882
Citation:
Online since:
September 2003
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