Hall Measurements of Inversion and Accumulation-Mode 4H-SiC MOSFETs
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p.1041
Correlation between Inversion Channel Mobility and Interface Traps near the Conduction Band in SiC MOSFETs
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p.1045
Influence of the Wet Re-Oxidation Procedure on Inversion Mobility of 4H-SiC MOSFETs
p.1049
p.1049
Influence of the Crystalline Quality of Epitaxial Layers on Inversion Channel Mobility in 4H-SiC MOSFETs
p.1053
p.1053
A Large Reduction in Interface-State Density for MOS Capacitor on 4H-SiC (11-2 0) Face Using H2 and H2O Vapor Atmosphere Post-Oxidation Annealing
p.1057
p.1057
Significant Improvement of Inversion Channel Mobility in 4H-SiC MOSFET on (11-20) Face Using Hydrogen Post-Oxidation Annealing
p.1061
p.1061
4H-SiC MOSFETs on (03-38) Face
p.1065
p.1065
Improved Channel Mobility in Normally-Off 4H-SiC MOSFETs with Buried Channel Structure
p.1069
p.1069
4H-SiC ACCUFET with a Two-Layer Stacked Gate Oxide
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p.1073
A Large Reduction in Interface-State Density for MOS Capacitor on 4H-SiC (11-2 0) Face Using H2 and H2O Vapor Atmosphere Post-Oxidation Annealing
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 389-393)
Pages:
1057-1060
Citation:
Online since:
April 2002
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