Range Parameters of Aluminium Implanted Targets
p.107
p.107
Identifitcation of Bandgap States in Semiconductors by Transmutation of Implanted Radioactive Tracers
p.113
p.113
Hall Effect Measurements on Transmutation Doped Semiconductors
p.119
p.119
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation
p.125
p.125
In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
p.129
p.129
Hardness Enhancement and Crosslinking Mechanisms in Polystyrene Irradiated with High Energy Ion-Beams
p.135
p.135
Diffusion Studies in Polymers Using MeV Ion Beams
p.147
p.147
Ion Induced Passivation of Metal Surfaces: The Phenomenon and its Origins
p.155
p.155
Flux Pinning by Columnar Defects in Bi2Sr2CaCu2O8-Thin Films
p.159
p.159
In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 248-249)
Pages:
129-134
Citation:
Online since:
May 1997
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