Analog Circuit Fault Diagnosis Using LDA and OAOSVM Approach

Ke Guo; Yi Zhu; Ye San

doi:10.4028/www.scientific.net/AMR.490-495.1130

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 490-495Analog Circuit Fault Diagnosis Using LDA and...

Analog Circuit Fault Diagnosis Using LDA and OAOSVM Approach

Abstract:

Fault diagnosis of analog circuits is essential for guaranteeing the reliability and maintainability of electronic systems. Analog circuit fault diagnosis can be regarded as a pattern recognition issue and addressed by Multi-class SVM. A novel diagnosis technique based on linear discriminant analysis and one-against-one SVM is proposed in the paper. In order to obtain a good SVM-based fault classifier, the linear discriminant analysis technique is adopted to capture the major fault features. The extracted fault features are then used as the inputs of one-against-one SVMs to solve fault diagnosis issue. The effectiveness of the proposed approach is demonstrated by the experimental results.

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Periodical:

Advanced Materials Research (Volumes 490-495)

Pages:

1130-1134

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.490-495.1130

Citation:

Cite this paper

Online since:

March 2012

Authors:

Ke Guo, Yi Zhu, Ye San

Keywords:

Analog Circuit, Fault Diagnosis, Feature Extraction, Linear Discriminant Analysis, One-against-One Support Vector Machine

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