Book/Dissertation / PhD Thesis

FZJ-2024-01717

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Quantitative atomic-level investigation of solid materials through multidimensional electron diffraction measurements

Lalandec-Robert, H. L. (Corresponding author)FZJ*

2024
Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag Jülich
ISBN: 978-3-95806-735-6

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Please use a persistent id in citations: doi:10.34734/FZJ-2024-01717

Abstract: The recording of a detailed diffraction pattern, as a function of scan position, was enabled in scanning transmission electron microscopy (STEM), thus giving rise to momentum-resolved STEM (MR-STEM). Whereas this technique provides a new framework for atomically-resolved quantitative analysis based on low-angle scattering, it also offers an opportunity to investigate single contributions to the intensity distribution in reciprocal space.

Note: Dissertation, RWTH Aachen, 2023

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)
2. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
2. moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317) (VH-NG-1317)

Appears in the scientific report 2024

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