Effect of In-Incorporation and Annealing on CuxSe Thin Films
Abstract
:1. Introduction
2. Materials and Methods
2.1. Materials
2.2. Treatment Methods
2.3. Investigative Methods
3. Results and Discussion
3.1. XRD Analysis
3.2. XPS Analysis
3.3. SEM/EDX Analysis
3.4. AAS Analysis
3.5. Optical Properties
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Copper(II/I) Ion Solution Treatment Conditions | Amount of Elements, μmol/cm2 | |||
---|---|---|---|---|
Temperature, °C | Duration, min | Cu | Se | In |
40 °C | 10 | 0.50 | 2.86 | 0.26 |
20 | 0.59 | 2.85 | 0.27 | |
60 °C | 5 | 0.69 | 2.95 | 0.29 |
10 | 0.78 | 2.89 | 0.32 |
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Ivanauskas, A.; Ivanauskas, R.; Ancutiene, I. Effect of In-Incorporation and Annealing on CuxSe Thin Films. Materials 2021, 14, 3810. https://doi.org/10.3390/ma14143810
Ivanauskas A, Ivanauskas R, Ancutiene I. Effect of In-Incorporation and Annealing on CuxSe Thin Films. Materials. 2021; 14(14):3810. https://doi.org/10.3390/ma14143810
Chicago/Turabian StyleIvanauskas, Algimantas, Remigijus Ivanauskas, and Ingrida Ancutiene. 2021. "Effect of In-Incorporation and Annealing on CuxSe Thin Films" Materials 14, no. 14: 3810. https://doi.org/10.3390/ma14143810