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Article

Rise Time and Peak Current Measurement of ESD Current from Air Discharges with Uncertainty Calculation

1
Department of Electrical and Electronics Engineering Educators, ASPETE—School of Pedagogical and Technological Education, 14121 N. Heraklion, Greece
2
Core Department, National and Kapodistrian University of Athens (NKUA), Euripus Complex, 34400 Psahna, Greece
*
Author to whom correspondence should be addressed.
Electronics 2022, 11(16), 2507; https://doi.org/10.3390/electronics11162507
Submission received: 18 July 2022 / Revised: 4 August 2022 / Accepted: 9 August 2022 / Published: 11 August 2022

Abstract

:
The greater number of electrostatic discharges (ESDs) that occur in nature is by air rather than by contact. However, due to low reproducibility in the current of air discharges, the IEC 61000-4-2 defines that the current’s calibration of an ESD gun must be made only for contact discharges. In the work presented here, there is an attempt to improve the poor reproducibility of air discharges by a significant observation derived from ESD measurements and, more specifically, the relationship between the rise time and the peak current for every ESD gun. This fact validated in this paper from current measurements of two different ESD guns will help all who are involved in ESD measurements in EMC laboratories by reducing the existing uncertainty in measurements of air discharges.

1. Introduction

Electrostatic discharge (ESD) is defined as the sudden release of energy between two objects when they come into contact; it is a physical phenomenon that is intertwined with many different aspects in many scientific fields [1,2]. It combines high voltages with charging voltages that are usually a few kV, electronics; the discharge current destroys high tech electronic equipment [3,4,5,6,7,8,9,10,11], and of course electromagnetic field and electromagnetic compatibility [12,13,14,15,16,17,18,19,20,21,22,23], vulnerable equipment that must be shielded against the transient electromagnetic fields (the phenomenon lasts only a few ns) coming from the ESD event and the severe consequences of the ESD current, which may reach some Amperes.
Due to the high importance of the phenomenon in everyday human activity involving high tech equipment (PCs, cellar phones, laptops, tablets, etc.), ESD immunity testing specifies the IEC 61000-4-2 [24]. This Standard prescribes the calibration procedure of the ESD generators (or guns) that simulate the real ESD current, which must be made only for contact discharges. This happens due to the high reproducibility of contact discharges in addition to air discharges, in which the peak current may differ from one discharge to another due to the different arcs that are produced [25,26,27,28,29]. It is also the simplest case to examine in an uncertainty evaluation budget. Certainly, it has to be mentioned that air discharges can have major electromagnetic impacts on equipment due to the higher peak current and faster rise times compared to the ones of contact discharges. This is due to the fact that many factors, such as test voltage, approach speed, electrode surface conditions, and climatic conditions, have a significant impact on the test results [30,31,32,33,34,35].
The conditions that preexist before air discharges occur have been analyzed in various studies. In [36], the pre-charge conditions before the formation of the electric arc and for various gases are studied in depth. In [37], a new technique combining the surface and avalanche process during air discharges in short gaps is proposed. In [38], the effect of the shapes of metal electrodes on ESD current and radiation noise is discussed. In [39], the results indicated that as temperature decreases, or pressure increases, the electrostatic breakdown voltage increases, while in [40], the approach speed on spark length during air discharges with different temperature and humidity is examined. In a recent study [41], a model is constructed to make both the varied plasma velocities reported in the literature understandable, and also make predictions about the arc radio-frequency interference, contamination produced by the arcs, and the total charge in an arc possible.
The spark formation has been studied extensively [25]. Air discharges that accompany a spark are severer than contact discharges and play a significant role in the malfunction of electronic devices. However, they have not been quantitatively evaluated and the IEC Standard [24] is mainly focused on air discharges. In the current work, measurements of the discharge current during air discharges for the Pellegrini target placed in the center of a grounded metal surface (1.5 × 1.5 m2) have been conducted and the relationship between the peak current and the rise time is investigated with respect to the uncertainty of the measurements and the possibility of improving the testing reproducibility. It was proved that that the ratio of the peak current (Ip) to the charging voltage (Uc) has a good exponential relationship with rising time, although the experimental conditions cannot be exactly the same at each air discharge.

2. The IEC 61000-4-2

The Human Body Model (HBM) pulse that an ESD gun has to produce is depicted in Figure 1, according to IEC 61000-4-2 [24]. The rise time (tr) of the discharge current is 0.8 ns (±25%), and its amplitude is determined by the ESD gun’s charging voltage. There are four parameters of the ESD current: The rise time (tr), the peak discharge current (Ip), the current at 30 ns (I30), and the current at 60 ns (I60). These two current values I30 and I60 are determined for a period of 30 ns and 60 ns, respectively, commencing at the time point when the current equals 10% of the peak current, as shown in Figure 1. The limits of these parameters, as shown in Table 1, are solely valid for contact discharges.
In the current Standard, the air discharge method is defined as the method where the charged electrode of the test generator moves towards the Equipment under Test (EUT) until it touches the EUT. Additionally, in the case of air discharge testing, the climatic conditions shall be within the following ranges: (a) For the ambient temperature: 15 °C to 35 °C; (b) For the relative humidity: 30% to 60% and (c) For the atmospheric pressure: 86 kPa (860 mbar) to 106 kPa (1060 mbar). Additionally, it defines that during air discharges the ESD generator shall approach the EUT as fast as possible, while the applied charging voltages are the same to the contact discharges, as shown in Table 1, with voltages up to 15 kV.

3. Test Setup

Figure 2 shows the test setup for the measurement of the ESD current from air discharges. Two ESD guns were used, the Schaffner’s NSG-433 and the NSG-438. The target was placed in the center of a metallic grounded plate with dimensions 1.5 × 1.5 m2, 70 cm above the ground and it was connected with a 2.5 GHz wide band oscilloscope through a coaxial cable of 50 Ohms. Two charging voltages of 2 kV and 4 kV were applied for each gun. For every charging voltage, twenty measurements of air discharges were conducted.
During the experiment, a high-speed scenario is simulated, since the approach speed is kept constant at around 0.5 m/s. In order for the measurement set-up to be unaffected by surrounding systems, the experiment was conducted in an anechoic chamber. The temperature, the relative humidity and the atmospheric pressure were measured and found in the ranges 21 ± 2 °C, 45 ± 5% and 1000 mbar ± 5%, respectively. The charging voltages for both the two ESD guns were 2 kV and 4 kV.
The pre-charge level can be derived with a very good approximation from the breakdown field between two parallel plates, as shown below [36].
V = B · p · d · C + ln p · d
In (1), B and C are parameters dependent on the composition of the gas, p is the gas pressure, and d is the distance between the plates. For air, B = 365 V/(cm·Torr) and C = 1.18.
It is known that the position of the ground strap affects the falling edge of the current’s waveform. In order to minimize the uncertainty of this fact, the ground strap was at a distance 1 m from the target as the Standard defines and the loop was as large as possible

4. Uncertainty in Measurements

4.1. Short Introduction to Uncertainty

Today it is not only of great importance that the instruments we use to measure can do so correctly, but “how” correctly they measure is also essential. The processes around the subject of measurement have led to the acceptance of a single mechanism for the quantitative assessment of the quality of measurement called uncertainty [42,43,44,45]. Uncertainty is defined as “a parameter associated with the result of a measurement, which characterizes the dispersion of values that could reasonably be attributed to the measured quantity” [43].
The meanings of error and uncertainty are often confused. The term uncertainty is usually compared to the term error, which has long been used to characterize the deviation of a measurement from the true value of the measured quantity. Error is defined as “the difference between the result of a measurement and a true value of the measured quantity”. From the above definition, what should be emphasized is the use of the indefinite article “a”. The reason is that there may be more than one value compatible with the definition of the measured quantity and that we cannot know what the “true” value is. In theory, the true value could only be the result of a perfect ideal measurement. The result of a measurement characterized by negligible uncertainty can be referred to as a “conventional true value”.
From the above, it becomes clear that the error has no particular practical utility since it is based on a deterministic view of things. Thoughtfulness is what prevails in measurements. Error refers to a point (value), while uncertainty refers to a range of values. Figure 3 and Figure 4 further help to clarify the two meanings.

4.2. Calculation of Uncertainties

In general, measurement uncertainty is made up of many components that can be divided into two types based on how they are calculated. Type A uncertainty is assessed using statistical analysis of an observation series, whereas Type B uncertainty is calculated using any available information about the variability of the measured quantity, such as calibration certificates, previous measurements, measuring equipment specifications, the operational procedure, and the subjective judgment of the person performing the measurements [44].
In this work Type A uncertainty is calculated as the repeatability of the measurements, as shown in the following Equation (2):
U A = S A n A = 1 n A n A 1 i = 1 n A x i x m 2
where nA is the number of the air discharges, xi is the measured value, xm is the mean value of nA measurements and sA is the standard deviation from the mean value.
After the Type A uncertainty calculation, we must proceed with the calculation of Type B uncertainty, knowing the distribution that each source of uncertainty follows and which is given by the following equation:
U B = i = 1 N U B i 2 = i = 1 N S B i k i 2
where, sB is the limit value of source i, and ki is the coverage factor of the corresponding distribution.
The combined standard uncertainty UC and the expanded uncertainty U are given by Equations (4) and (5).
U C = U A 2 + U B 2
U = k U C
The coverage factor k for a coverage probability of 95% is 2.

5. Results and Discussion

5.1. Measurement Results

Figure 5 depicts typical waveforms of air discharges for the two different ESD guns using the experimental setup described before. It is obvious that these two current waveforms differ. The peak current of the NSG-433 gun is higher than the one of NSG-438, with an average value higher than the one of the second gun. This happens because these current waveforms are referred to air discharges, where there is a great difference in the values of tr and Ip, as can be seen in the following Table 2. The electric arc in air discharges is very difficult to reproduce in every air discharge, although it was with great effort that we attempted to ensure that the conditions were similar for the two ESD guns from air discharge to air discharge.
In Table 2 below and in Figure 6 and Figure 7, twenty different measurements of the rise time and the peak current for air discharges for the two different ESD guns and for two different charging voltages (+2 kV and +4 kV) are presented. In the same Table, the average values, the standard deviation and the uncertainty (type A) of these measurements are also included.
In the following Figure 8 and Figure 9 the relationship between the peak current to the charging voltage (Ip/Uc) and the rise time for the two different ESD guns and for air discharging are presented. It is obvious that Ip/Uc has a good exponential relationship with rising time, although there are different conditions in the experiment. This proves that Ip, tr and Uc have a relation independently to the approach speed which is:
I p V C t r a = c
where c is a number depending on the constructional details of the ESD gun and α an index depending on the experimental conditions and the ESD gun type. Making the best fitting exponential curve the measured data of the two ESD guns α = 0.66 and c = 0.0031 for the NSG-433 ESD gun, while for the NSG-438 α = 0.52 and c = 0.0024.

5.2. Uncertainty Calculations

The average values and uncertainty Type A of the peak current (Ip) and the rise time (tr) are presented in Table 2. The combined standard uncertainty and the expanded uncertainty of Ip and tr are calculated in Table 3 and Table 4, respectively.

5.3. Results Discussion

The measurement evaluation process heavily relies on the uncertainties. The accuracy of the measurements may be severely compromised, and any argument based on experimentation may suffer if the uncertainty levels are too high. While the parameters that were kept constant (temperature and humidity) were not considered to participate in the uncertainty values, the uncertainty calculation method of ESD current parameters took into consideration some uncertainty sources that may interfere with the results. Special consideration was given to the arc and, therefore, the ESD guns were approaching the target quickly enough as an effort to maintain a modest and constant arc length.
Type B uncertainty has a very small contribution to the overall uncertainty for the peak current. In addition, for the rise time, Type B uncertainty is comparable to the Type A uncertainty. The values of the uncertainties are higher than the ones suggested in [24] for the ESD current parameters. This is not surprising since air discharges (through the arc) cannot be repeated in the same way each time. However, in the previous paragraph and from the measurement analysis, it was found that no matter the charging voltage or the approaching speed, there is a relationship between the rise time and the peak current as it is described in Equation (1) and it is unique for each ESD gun. This improves the reproducibility of the air discharges, and it can be used in further analyses and examinations of the complicated phenomenon of ESD air discharges. Air discharges are used during ESD tests in order to check that the ESD gun produces a proper current waveform; this is a way to make a short verification of the gun. A laboratory technique could be developed during the verification of ESD air discharges ensuring their reproducibility, since there exists a steady relationship between tr and Ip.
Previous laboratory measurements could be quite helpful. The standard deviation would be less as the number of measurements increases and assuming a normal distribution. Given a normal distribution and an increase in the number of measurements utilizing our measurement system, the standard deviation would decrease as the number of measurements increased. As the overall uncertainty might be reduced even further, measurement data could be given with more assurance.

6. Conclusions

In this work, we dealt with the task of uncertainty calculation of the rise time and the peak current for air discharges and for two different ESD guns. A calculation method of these uncertainties was proposed, taking into consideration two types of uncertainty: Type A and Type B. The proper equipment and experimental setup were also described, helping to capture the current waveform satisfactorily and maintain low levels of uncertainty.
Updated restrictions for the ESD parameters have to be studied, since measuring instruments become faster and the unknown features of the air discharge phenomenon are lowered. It should be considered for future work to lessen the uncertainty, possibly by using a measurement device with a higher bandwidth. Additionally, a correlation between the rise time and the peak current for each ESD gun was found and it could be used in the future reproducibility of ESD guns during air discharges, which could be included in the next IEC revision [24].

Author Contributions

Conceptualization, G.F., V.V. and T.I.M.; methodology, G.F., V.V. and T.I.M.; validation G.F., V.V. and T.I.M.; formal analysis, G.F., V.V. and T.I.M.; writing—Original draft preparation, G.F., V.V. and T.I.M.; writing—Review and editing, G.F., V.V. and T.I.M. All authors have read and agreed to the published version of the manuscript.

Funding

The authors acknowledge partial financial support for the publication of this work from (a) the Special Account for Research of ASPETE and (b) National and Kapodistrian University of Athens (NKUA).

Conflicts of Interest

The authors declare no conflict of interest.

References

  1. Wang, A. Practical ESD Protection Design, 1st ed.; Wiley: Hoboken, NJ, USA; IEEE Press: Piscataway, NJ, USA, 2021. [Google Scholar]
  2. Bafleur, M.; Caignet, F.; Nolhier, N. ESD Protection Methodologies: From Component to System, 1st ed.; ISTE Press: London, UK; Elsevier: Amsterdam, The Netherlands, 2017. [Google Scholar]
  3. Yousaf, J.; Shin, J.; Lee, H.; Nah, W.; Youn, J.; Lee, D.; Hwank, C. Efficient Circuit and an EM Model of an Electrostatic Discharge Generator. IEEE Trans. Electromagn. Compat. 2018, 60, 1078–1086. [Google Scholar] [CrossRef]
  4. Pommerenke, D. EMC fundamentals—ESD. In Proceedings of the IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Gaithersburg, MD, USA, 4–12 August 2017. [Google Scholar] [CrossRef]
  5. Zhou, J.; Guo, Y.; Shinde, S.; Hosseinbeig, A.; Patnaik, A.; Izadi, O.H.; Zeng, C.; Shi, J.; Maeshima, J.; Shumiya, H.; et al. Measurement Techniques to Identify Soft Failure Sensitivity to ESD. IEEE Trans. Electromagn. Compat. 2020, 62, 1007–1016. [Google Scholar] [CrossRef]
  6. Lin, H.; He, S.-Z.; Wang, Y.-L.; Liang, X.-S.; Ji, Q.-Z. Study on Electrostatic Discharge Damage and Defect Damage Failure Analysis Technology for Semiconductor Devices. In Proceedings of the 19th International Conference on Electronic Packaging Technology (ICEPT), Shanghai, China, 8–11 August 2018. [Google Scholar] [CrossRef]
  7. Liu, Y.; Chen, R.; Li, B.; En, Y.F.; Chen, Y.Q. Analysis of Indium–Zinc–Oxide Thin-Film Transistors Under Electrostatic Discharge Stress. IEEE Trans. Electron Devices 2018, 65, 356–360. [Google Scholar] [CrossRef]
  8. Kuznetsov, V. HBM, MM, and CBM ESD Ratings Correlation Hypothesis. IEEE Trans. Electromagn. Compat. 2018, 60, 107–114. [Google Scholar] [CrossRef]
  9. Katsivelis, P.K.; Fotis, G.P.; Gonos, I.F.; Koussiouris, T.G.; Stathopulos, I.A. Electrostatic Discharge Current Linear Approach and Circuit Design Method. Energies 2010, 3, 1728–1740. [Google Scholar] [CrossRef] [Green Version]
  10. Vita, V.; Fotis, G.P.; Ekonomou, L. An Optimization Algorithm for the Calculation of the Electrostatic Discharge Current Equations’ Parameters. WSEAS Trans. Circuits Syst. 2016, 15, 224–228. [Google Scholar]
  11. Vita, V.; Fotis, G.P.; Ekonomou, L. Parameters’ optimisation methods for the electrostatic discharge current equation. Int. J. Energy 2017, 11, 1–6. [Google Scholar]
  12. Wilson, P.F.; Ma, M.T. Field radiated by electrostatic discharges. IEEE Trans. Electromagn. Compat. 1991, 33, 10–18. [Google Scholar] [CrossRef]
  13. Kim, K.C.; Lee, K.S.; Lee, D.I. Estimation of ESD current waveshapes by radiated electromagnetic fields. IEICE Trans. Commun. 2000, E83-B, 608–612. [Google Scholar]
  14. Ishigami, S.; Gokita, R.; Nishiyama, Y.; Yokoshima, I. Measurements of fast transient fields in the vicinity of short gap discharges. IEICE Trans. Commun. 1995, E78-B, 199–206. [Google Scholar]
  15. Frei, S.; Pommerenke, D. A transient field measurement system to analyze the severity and occurrence rate of electrostatic discharge (ESD). J. Electrost. 1998, 44, 191–203. [Google Scholar] [CrossRef]
  16. Leuchtmann, P.; Sroka, J. Transient field simulation of electrostatic discharge (ESD) in the calibration setup (ace. IEC 61000-4-2). In Proceedings of the International Symposium on EMC, Washington, DC, USA, 21–25 August 2000. [Google Scholar]
  17. Leuchtmann, P.; Sroka, J. Enhanced field simulations and measurements of the ESD calibration setup. In Proceedings of the International Symposium on EMC, Montreal, QC, Canada, 13–17 August 2001. [Google Scholar]
  18. Becanovic, N.; Mousavi, S.M.; Fellner, G.; Pommerenke, D. A Portable Test Platform for Capturing ESD Induced Fields. In Proceedings of the IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Raleigh, NC, USA, 26 July–13 August 2021. [Google Scholar] [CrossRef]
  19. Li, D.Z.; Zhou, J.; Hosseinbeig, A.; Pommerenke, D. Transient electromagnetic co-simulation of electrostatic air discharge. In Proceedings of the 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Tucson, AZ, USA, 10–14 September 2017. [Google Scholar] [CrossRef]
  20. Ishigami, S.; Kawamata, K.; Minegishi, S.; Fujiwara, O. Measurement of electric field waveform caused by micro gap ESD in a pair of spherical electrodes. In Proceedings of the Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Seoul, Korea, 20–23 June 2017. [Google Scholar] [CrossRef]
  21. Kawamata, K.; Ishigami, S.; Minegishi, S.; Fujiwara, O. Distance characteristic of electric field waveform and field peak value caused by micro gap ESD in a pair of spherical electrodes. In Proceedings of the International Symposium on Electromagnetic Compatibility—EMC EUROPE, Angers, France, 4–7 September 2017. [Google Scholar] [CrossRef]
  22. Fotis, G.; Ekonomou, L.; Maris, T.I.; Liatsis, P. Development of an artificial neural network software tool for the assessment of the electromagnetic field radiating by electrostatic discharges. IET Sci. Meas. Technol. 2007, 1, 261–269. [Google Scholar] [CrossRef]
  23. Fotis, G.; Vita, V.; Ekonomou, L. Machine Learning Techniques for the Prediction of the Magnetic and Electric Field of Electrostatic Discharges. Electronics 2022, 11, 1858. [Google Scholar] [CrossRef]
  24. IEC 61000-4-2. Electromagnetic Compatibility (EMC)—Part 4-2: Electrostatic Discharge Immunity Test, ed. 2.0. 2008. Available online: https://webstore.iec.ch/publication/4189 (accessed on 22 June 2022).
  25. Pommerenke, D. ESD: Transient fields, arc simulation and rise time limit. J. Electrost. 1995, 36, 31–54. [Google Scholar] [CrossRef]
  26. Xu, X.; Li, Q.; Li, Q.; Wang, D. Study on the Relation of Electrostatic Discharge Parameters. In Proceedings of the 8th International Conference on Electronic Measurement and Instruments, Xi’an, China, 16–18 August 2007. [Google Scholar] [CrossRef]
  27. Mori, I.; Fujiwara, O.; Ishigami, S. Rise Time Limit of Discharge Current for Air Discharge of an ESD-gun. In Proceedings of the 4th Asia-Pacific Conference on Environmental Electromagnetics, Dalian, China, 1–4 August 2006. [Google Scholar] [CrossRef]
  28. Xiu, Y.; Sagan, S.; Battini, A.; Ma, X.; Raginsky, M.; Rosenbaum, E. Stochastic modeling of air electrostatic discharge parameters. In Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA, 11–15 March 2018. [Google Scholar] [CrossRef]
  29. Borsero, M.; Caniggia, S.; Sona, A.; Stellini, M.; Zuccato, A. A new proposal for the uncertainty evaluation and reduction in air electrostatic discharge tests. In Proceedings of the International Symposium on Electromagnetic Compatibility—EMC Europe, Hamburg, Germany, 8–12 September 2008. [Google Scholar] [CrossRef]
  30. Ishida, T.; Fujiwara, O. Further Effects of Test Voltages, Relative Humidity and Temperature on Air Discharge Currents from Electrostatic Discharge Generator. In Proceedings of the Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan, 3–7 June 2019. [Google Scholar] [CrossRef]
  31. Worshevsky, A.; Grishakov, E.; Dogorov, D. Parameters of current and equipment case voltage produced by air electrostatic discharge. In Proceedings of the International Symposium on Electromagnetic Compatibility—EMC EUROPE, Rome, Italy, 23–25 September 2020. [Google Scholar] [CrossRef]
  32. Ishida, T.; Xiao, F.; Kami, Y.; Fujiwara, O.; Nitta, S. An alternative air discharge test in contact discharge of ESD generator through fixed gap. In Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (EMC), Ottawa, ON, Canada, 25–29 July 2016. [Google Scholar] [CrossRef]
  33. Taka, Y.; Kawamata, K.; Fujiwara, O. Dependence of grounded metal-plate’s approach speed on spark length for air discharges of electrostatic discharge generator. In Proceedings of the Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), Taipei, Taiwan, 26–29 May 2015. [Google Scholar] [CrossRef]
  34. Zhou, J.; Zhou, K.; Yan, X.; Shen, L.; Pommerenke, D.; Luo, G. Investigations into Methods to Stabilize the Spark in Air Discharge ESD. In Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC + SIPI), New Orleans, LA, USA, 22–26 July 2019. [Google Scholar] [CrossRef]
  35. Yang, S.; Bhandare, A.; Rezaei, H.; Huang, W.; Pommerenke, D.J. Step-Response-Based Calibration Method for ESD Generators in the Air-Discharge Mode. IEEE Trans. Electromagn. Compat. 2018, 60, 1598–1601. [Google Scholar] [CrossRef]
  36. Meek, J.M.; Craggs, J.D. Electrical Breakdown of Gases; Wiley: NewYork, NY, USA, 1978. [Google Scholar]
  37. Bonisch, S.; Kalkner, W.; Pommerenke, D. Modeling of short-gap ESD under consideration of different discharge mechanisms. IEEE Trans. Plasma Sci. 2003, 31, 736–744. [Google Scholar] [CrossRef] [Green Version]
  38. Yoshida, T.; Yoshihara, H.; Kawasaki, K.; Masui, N. Effect of the shapes of metal electrodes on ESD current and radiation noise. In Proceedings of the 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility, Beijing, China, 12–16 April 2010. [Google Scholar] [CrossRef]
  39. Xu, H.; Chi, X.; Fan, X.; Chen, J.; Liu, W.; Li, Z. Electrostatic Discharge Characteristics of Typical Gases. In Proceedings of the 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE), Beijing, China, 6–10 September 2020. [Google Scholar] [CrossRef]
  40. Ishida, T.; Tozawa, Y.; Fujiwara, O. Effect of Approach Speed on Spark Length determining Air Discharge Current from ESD Generator in Environment with Different Temperature and Humidity. In Proceedings of the 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Raleigh, NC, USA, 26 July–13 August 2021. [Google Scholar] [CrossRef]
  41. Ferguson, D.C.; Hoffmann, R.C.; Plis, E.; Engelhart, D. Arc Plasma Propagation and Arc Current Profiles. IEEE Trans. Plasma Sci. 2019, 47, 3842–3847. [Google Scholar] [CrossRef]
  42. Lemaire, M. Mechanics and Uncertainty, 1st ed.; Wiley: Hoboken, NJ, USA; ISTE Press: London, UK, 2014. [Google Scholar]
  43. Lindley, D. Understanding Uncertainty; Wiley: Hoboken, NJ, USA, 2013. [Google Scholar]
  44. United Kingdom Accreditation Service (UKAS). The Expression of Uncertainty and Confidence in Measurement. Available online: https://www.ukas.com/wp-content/uploads/schedule_uploads/759162/M3003-The-Expression-of-Uncertainty-and-Confidence-in-Measurement.pdf (accessed on 15 July 2022).
  45. ISO/TS 20914:2019. Medical Laboratories—Practical Guidance for the Estimation of Measurement Uncertainty. Available online: https://www.iso.org/obp/ui/#iso:std:iso:ts:20914:ed-1:v1:en (accessed on 15 July 2022).
Figure 1. Typical waveform of the output current of the ESD gun for contact discharges.
Figure 1. Typical waveform of the output current of the ESD gun for contact discharges.
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Figure 2. Test set-up during air discharges.
Figure 2. Test set-up during air discharges.
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Figure 3. Difference between uncertainty and error.
Figure 3. Difference between uncertainty and error.
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Figure 4. Measurement’s error and uncertainty.
Figure 4. Measurement’s error and uncertainty.
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Figure 5. Typical current waveforms for air discharges from two different ESD guns when the charging voltage is +4 kV.
Figure 5. Typical current waveforms for air discharges from two different ESD guns when the charging voltage is +4 kV.
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Figure 6. Rise time measurements for the two ESD guns for charging voltages of +2 kV and +4 kV.
Figure 6. Rise time measurements for the two ESD guns for charging voltages of +2 kV and +4 kV.
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Figure 7. Peak current measurements for the two ESD guns for charging voltages of +2 kV and +4 kV.
Figure 7. Peak current measurements for the two ESD guns for charging voltages of +2 kV and +4 kV.
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Figure 8. Relationship between the peak current to charging voltage (Ip/Uc) and the rise time (tr) for the NSG-433 ESD gun.
Figure 8. Relationship between the peak current to charging voltage (Ip/Uc) and the rise time (tr) for the NSG-433 ESD gun.
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Figure 9. Relationship between the peak current to charging voltage (Ip/Uc) and the rise time (tr) for the NSG-438 ESD gun.
Figure 9. Relationship between the peak current to charging voltage (Ip/Uc) and the rise time (tr) for the NSG-438 ESD gun.
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Table 1. Waveform parameters of the ESD current for contact dicharges.
Table 1. Waveform parameters of the ESD current for contact dicharges.
LevelCharging Voltage (kV)Ip (A)Accepted Deviationtr (ns)Accepted DeviationI30 (A)Accepted DeviationI60 (A)Accepted Deviation
127.5±15%0.8±25%4±30%2±30%
241584
3622.5126
4830168
Table 2. Rise time and peak current measurements for two different ESD guns and for two different charging voltages.
Table 2. Rise time and peak current measurements for two different ESD guns and for two different charging voltages.
Measurement NumberNSG-433NSG-438
+2 kV+4 kV+2 kV+4 kV
tr
(ns)
Ip
(A)
tr
(ns)
Ip
(A)
tr
(ns)
Ip
(A)
tr
(ns)
Ip
(A)
10.32113.020.74513.840.7125.750.40514.55
20.6527.750.33122.090.5466.510.65112.25
30.26314.520.51417.090.6496.150.68811.95
40.7107.520.89912.960.7365.650.50113.22
50.42510.520.62114.920.5696.450.60212.75
60.7957.120.42819.230.8125.410.89710.35
70.5349.050.73614.750.4797.020.30416.95
80.7707.220.56816.500.7265.710.22919.61
90.8126.850.33921.050.4017.790.23519.33
100.6428.010.63214.850.4617.230.44014.02
110.5698.650.53116.540.5276.650.53312.69
120.6288.250.72614.820.4986.980.51012.93
130.6697.620.66715.270.4327.520.69111.86
140.6587.650.64314.410.3588.250.78911.08
150.5199.250.45918.050.5946.350.58212.10
160.6128.440.54917.90.6985.850.59911.93
170.5568.940.60515.050.5126.710.69011.89
180.43510.350.70514.850.5796.390.61212.61
190.25914.560.63914.440.4127.670.60912.65
200.7367.250.24929.350.6156.210.55512.28
Average Values0.5789.130.57916.900.5666.610.55613.35
Standard deviation0.1662.350.1603.780.1260.790.1722.49
Uncertainty Type A0.0370.530.0360.850.0280.180.0380.56
Relative Uncertainty Type A (%)6.4335.776.1705.005.0002.666.8984.18
Table 3. Combined Standard Uncertainty for Ip.
Table 3. Combined Standard Uncertainty for Ip.
ContributorDistributionValue (%)Devisorui (%) u i 2   ( % ) 2 Source
NSG-433NSG-438 NSG-433NSG-438NSG-433NSG-438
2 kV4 kV2 kV4 kV 2 kV4 kV2 kV4 kV2 kV4 kV2 kV4 kV
Type ARepeatabilityNormal5.775.002.664.1815.775.002.664.1833.2925.007.0817.47Table 2
Type BVertical reading of oscilloscope’s indicationNormal0.8220.410.17Certificate of calibration
Measuring chain Pellegrini target-attenuator-cableNormal1.0420.520.27Certificate of calibration
Chain to oscilloscope failureU shaped1.08 2 0.760.58Certificate of calibration
Approach to the targetNormal1.0020.500.25Experience of the Lab
U C 2 34.5626.277.6618.74
Combined Standard Uncertainty UC (%) Equation (4) 5.885.132.774.33
Expanded Uncertainty (for k = 2) U (%) Equation (5) 11.7610.265.548.66
Table 4. Combined Standard Uncertainty for tr.
Table 4. Combined Standard Uncertainty for tr.
ContributorDistributionValue (ps)Devisorui (ps) u i 2   ( ps ) 2 Source
NSG-433NSG-438 NSG-433NSG-438NSG-433NSG-438
2 kV4 kV2 kV4 kV 2 kV4 kV2 kV4 kV2 kV4 kV2 kV4 kV
Type ARepeatabilityNormal37.2035.7428.2938.36137.2035.7428.2938.361383.841277.35800.321471.49Table 2
Type BPeak value readingNormal50.00225.00625.00Uncertainty of Peak Value 3%
Time I90 readingRectangular25.00 3 14.43208.23Oscilloscope’s sampling rate 20 Gs/s
Time I10 readingRectangular25.00 3 14.43208.23Oscilloscope’s sampling rate 20 Gs/s
Vertical reading of oscilloscope’s indicationNormal30.00215.00225.00Certificate of Calibration
Measuring chain cable—Attenuator—Pellegrini targetNormal30.00215.00225.00Certificate of Calibration
U C 2 2875.32768.812291.782962.95
Combined Standard Uncertainty UC Equation (4) 53.6352.6247.8754.43
Expanded Uncertainty (for k = 2) U Equation (5) 107.26105.2495.74108.86
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Fotis, G.; Vita, V.; Maris, T.I. Rise Time and Peak Current Measurement of ESD Current from Air Discharges with Uncertainty Calculation. Electronics 2022, 11, 2507. https://doi.org/10.3390/electronics11162507

AMA Style

Fotis G, Vita V, Maris TI. Rise Time and Peak Current Measurement of ESD Current from Air Discharges with Uncertainty Calculation. Electronics. 2022; 11(16):2507. https://doi.org/10.3390/electronics11162507

Chicago/Turabian Style

Fotis, Georgios, Vasiliki Vita, and Theodoros I. Maris. 2022. "Rise Time and Peak Current Measurement of ESD Current from Air Discharges with Uncertainty Calculation" Electronics 11, no. 16: 2507. https://doi.org/10.3390/electronics11162507

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