Genetika 2020 Volume 52, Issue 3, Pages: 1107-1125
https://doi.org/10.2298/GENSR20107B
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Mapping wheat QTLS for grain yield related traits under high temperature stress
Barakat Mohamed N. (Biotechnology Laboratory, Crop Science Department, Faculty of Agriculture, University of Alexandria, Egypt), mnrbarakat@yahoo.com
Al-Doss Abdullah A. (College of Food and Agriculture Sciences, King Saud University, Riyadh, Saudi Arabia)
Moustafa Khaled A. (College of Food and Agriculture Sciences, King Saud University, Riyadh, Saudi Arabia)
Motawei Mohamed I. (Biotechnology Laboratory, Crop Science Department, Faculty of Agriculture, University of Alexandria, Egypt + Faculty of Agriculture and Veterinary Medicine, Qassim University, Buridah, Saudi Arabia)
Al-Ashkar Ibrahim M. (College of Food and Agriculture Sciences, King Saud University, Riyadh, Saudi Arabia + Agronomy Department, Faculty of Agriculture, Al- Azhar University, Cairo, Egypt)
Al-Otayk Soleman M. (Faculty of Agriculture and Veterinary Medicine, Qassim University, Buridah, Saudi Arabia)
Alamri Mohamed S. (College of Food and Agriculture Sciences, King Saud University, Riyadh, Saudi Arabia)
Mergoum Mohamed (Department of Crop and Soil Sciences, College of Agriculture & Environmental Sciences, University of Georgia, USA)
Stress induced by high temperature represents a major constraint over wheat
production in many production areas. Here, the comprehensive coverage of the
wheat genome achievable using single nucleotide polymorphism markers was
exploited to carry out a genetic analysis targeting yield components in
plants exposed to high temperature stress. The mapping population was a set
of doubled haploid lines derived from a cross between the cultivars Yecora
Rojo and Ksu106. Both of the parental cultivars and their derived population
were tested in the field in two locations over two consecutive seasons; at
each site, two sowing dates were included, with the later sowing intended to
ensure that the plants were exposed to high temperature stress during the
grain filling period. Composite interval mapping detected 93 quantitative
trait loci influencing grain yield and some related traits, along with 20
loci associated with a “heat susceptibility index” (HSI). The loci were
distributed over all 21 of the wheat chromosomes. Some of these loci were of
large enough effect to be considered as candidates for the marker-assisted
breeding of high temperature tolerance in wheat.
Keywords: heat stress, grain yield, SNP markers, Triticum aestivum