The Review of Laser Engineering
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
Optical Waveguide Characterization of Thin Films
François FLORYHervé RIGNEAULTJ. MASSANEDASerge MONNERET
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1996 Volume 24 Issue 1 Pages 94-102

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Abstract

Guided wave techniques are powerful to study the properties of different optical coatings. The latest results are presented to illustrate the interest of these techniques: the dependence on ion energy of the anisotropy of ion assisted TiO2 films is given; the measurement of losses during propagation permits to study the origin of losses in multilayer coatings and in particular to demonstrate that absorbing transition layers have to be introduced in the model; properties of ion implanted Ta2O5 layers are also investigated. The refractive index profile of Ta2O5 layers implanted with Ti is determined by using the m-line technique; coupling a pump beam at 488 nm in different guided modes, the photoluminescent properties around 1.53 mm of Er implanted Ta2O5 layers are also shown.

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© The Laser Society of Japan
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