Data Analysis Techniques for Microwave Imaging Reflectometry

Z. B. SHI; Y. NAGAYAMA; S. YAMAGUCHI; Y. HAMADA; Y. HIRANO

doi:10.1585/pfr.3.S1045

Regular Articles

Data Analysis Techniques for Microwave Imaging Reflectometry

Z. B. SHI, Y. NAGAYAMA, S. YAMAGUCHI, Y. HAMADA, Y. HIRANO

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Keywords: density fluctuation, microwave imaging reflectometry, ensemble average, wavelet, FFT.

JOURNAL FREE ACCESS

2008 Volume 3 Pages S1045

DOI https://doi.org/10.1585/pfr.3.S1045

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Abstract

A data analysis technique for microwave imaging reflectometry (MIR) in the Large Helical Devices (LHD) and TPE-RX plasmas has been investigated. In LHD, the fast Fourier transform (FFT) is employed. The statistical properties of the fluctuation spectra on MIR signals are quantified by the time-frequency analysis by the ensemble average technique. Statistical analyses using cross-correlation and coherence spectra reveal the characteristics of MHD modes, such as wave numbers, mode numbers, and phase velocity. In TPE-RX, the wavelet analysis is more useful because the phenomena are transient in TPE-RX plasma.

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