Abstract of annual meeting of the Surface Science of Japan
2015 International Joint Symposium on Recent Progress of Advanced Nanocharacterization
Session ID : 3Cp06
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Host: The Surface Science Society of Japan, The Vacuum Society of Japan

december3
Electrical property of ITO/Ru complex/Au nanoparticle device structure by conductive probe atomic force microscopy
*Tomohiro Takagi, Yoichi Otsuka, Naoyuki Tange, Satoshi Nishizima, Takuya Matsumoto
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[in Japanese]

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© 2015 The Surface Science Society of Japan
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