Nano-printed miniature compound refractive lens for desktop hard x-ray microscopy
Fig 6
Results from the first X-ray source (Thermo Scientific Kevex) with respect to the sample-lens-distance at the source setting of 45 kV/2 W.
a)–c) Images taken at SLDs of 9.8 mm (magnification factor M = 166), 21.8 mm (M = 74), and 54.8 mm (M = 28.9), all displayed to the same scale represented by the 25 μm scalebars. As the SLD decreased, the silica substrate on the right shadowed more of the CRLs. The pixelated appearance at low magnification (c) is due to the larger area imaged by each detector pixel. d) The measured intensity profiles of the spot images outlined by the yellow dotted lines in Fig 6A–6C are plotted, together with their respective Gaussian fits. Values are normalized to the baseline intensities of the images. e) A plot of the average measured focal spot size and standard deviation over the scanned range of SLDs. The standard deviations were < 0.14 μm for all measurements.