Robust Bayesian Fluorescence Lifetime Estimation, Decay Model Selection and Instrument Response Determination for Low-Intensity FLIM Imaging
Fig 3
Bi-exponential parameter estimation at low photon counts.
The uncertainty, as measured by the standard deviation of the estimated parameter distribution, in the bi-exponential decay parameter estimates obtained using ML, LS, and Bayesian analysis for the analysis of synthetic data simulating a bi-exponential decay (,
,
) for a range of intensities between 103 and 104 photon counts. In (a) and (c) the fractional errors in the estimated decay lifetimes versus photon count; in (b) and (d) the fractional errors in the initial amplitudes of the two decay components. In all cases, the normalised width is displayed only when the respective estimates are not biased by more than 5% of the true value.