Abstract
Semiconductor-doped glasses consisting of 100–1000-Å microcrystallites of CdSxSe1−x, embedded in borosilicate glass available commercially as color filters exhibit very interesting nonlinear effects. Degenerate four-wave mixing and phase conjugation arising from electronic processes have been reported in these glasses.1-3 Evidence for quantum size effects at low temperatures for electrons confined to microcrystallites has also been presented.4 These glasses provide potentially useful media for room-temperature nonlinear signal processing based on guided-wave or etalon devices due to their relatively large nonlinear index of refraction. Here we report on the measurement of the nonlinear index in these materials using an interferometric technique. The nonlinear index is measured for samples prepared in different growth conditions to examine the role of crystallite formation on optimization of the nonlinearity. An enhancement of the nonlinear index is obtained with some specific growth parameters.
© 1986 Optical Society of America
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