年次大会講演論文集
Online ISSN : 2433-1325
セッションID: 4331
会議情報
4331 画像相関法による電子デバイス中のひずみ計測(J05-4 基板信頼性,J05 電子情報機器,電子デバイスの熱制御と強度・信頼性評価)
宍戸 信之池田 徹宮崎 則幸
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会議録・要旨集 認証あり

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In this study, a system for measuring thermal strain in micro region of electronic packages using the digital image correlation was developed, and applied for measuring the distribution of strain in a cross-section of a print circuit board (PCB) during thermal cycle test. The warpage of the PCB expected from the measured strain accurately corresponded with the macroscopic warpage measured using a laser displacement meter. The accuracy of measured displacements was affected by image distortion caused by an optical system. An error correction method using a piezo stage was proposed to improve the accuracy of the system.

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© 2006 一般社団法人日本機械学会
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