The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics
Online ISSN : 2424-2837
2003
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OS6(2)-5(OS06W0390) Deformation Modes of Semi-Conductors : Determined from Nano-Indentation and Transmission Electron Microscopy
J. E. BradbyJ. S. WilliamsP. MunroeMiehael V. Swain
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Pages 107-

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© 2003 The Japan Society of Mechanical Engineers
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