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Measurement volume considerations in X-ray microdiffraction stress analysis

Published online by Cambridge University Press:  06 March 2012

I. C. Noyan*
Affiliation:
International Business Machines Corporation, Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598
S. K. Kaldor
Affiliation:
International Business Machines Corporation, Microelectronics Division, Hopewell Junction, New York 12533
*
a)Author to whom correspondence should be addressed; Electronic mail: noyan@us.ibm.com

Abstract

The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed.

Type
Special Section on Microanalysis
Copyright
Copyright © Cambridge University Press 2004

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