Mainak Banga
ABSTRACT
Testing the genuineness of a manufactured chip is an important step in an IC product life cycle. This becomes more prominent with the outsourcing of the manufacturing process, since the manufacturer may tamper the internal circuit behavior using Trojan circuits in the original design. Traditional testing methods cannot detect these stealthy Trojans because the triggering scenario, which activates it, is unknown. Recently, approaches based on side-channel analysis have shown promising results in detecting Trojans. In this paper, we propose a novel test generation technique that aims at magnifying the disparity between side-channel signal waveforms of tampered and genuine circuits to indicate the possibility of internal tampering. Experimental results indicate that our approach could magnify the likelihood of Trojans 4 to 20 times more than existing side-channel analysis based approaches.
- D. Agarwal, S. Baktir, D. Karakoy, P. Rohatgi, B. Sunar, "Trojan Detection using IC Fingerprinting", IBM Research Report, 2006.Google Scholar
- K. Nowaka, G. Carpenter, F. Gebara, J. Schaub, D. Agarwal, P. Rohatgi, W. E. Hall, S. Baktir, D. Karakoyunlu, B. Sunar, "IC Fingerprinting and Stable IS Sensors for Enhanced IC Trust, 2006.Google Scholar
- S. Pilli, S. S. Sapatnekar, "Power estimation considering statistical IC parametric variations"; ISCAS 1997, pp. 1524 -- 1527, vol.3.Google Scholar
- C. Fagot, O. Gascuel, P. Girard, C. Landrault, "On Calculating Efficient LFSR Seeds for Built-In Self Test"; Proc. Of European Test Workshop, 1999, pp 7--14. Google ScholarDigital Library
- G. Hetherington, T. Fryars, N. Tamarapalli, M. Kassab, A. Hassan, J. Rajski, "Logic BIST for large industrial designs: real issues and case studies"; ITC, 1999, pp. 358--367. Google ScholarDigital Library
- W.-T. Cheng; M. Sharma; T. Rinderknecht, C. Hill, "Signature Based Diagnosis for Logic BIST"; ITC 2006, Oct. 2006, pp. 1--9.Google Scholar
- L. J. Kohout, A. Yasinsac, E. McDuffie, "Activity profiles for intrusion detection" ; Fuzzy Information Processing Society, 2002. pp. 463--468.Google Scholar
- W. Li; S. M. Reddy, I. Pomeranz, "On reducing peak current and power during test"; Proc. IEEE computer society annual symposium, 2005, pp. 156--161. Google ScholarDigital Library
- D. Agarwal. et al, "The EM side-channel(s)" CHES 2002, v 2523 Lecture Notes on Computer Science, Springer-Verlag, pp. 29--45, 2002. Google ScholarDigital Library
- F. N. Najm, "Transition density: a new measure of activity in digital circuits;", IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, Vol 12, Issue 2, Feb. 1993 pp. 310--323.Google ScholarDigital Library
Index Terms
- Guided test generation for isolation and detection of embedded trojans in ics
Recommendations
A sensitivity analysis of power signal methods for detecting hardware Trojans under real process and environmental conditions
Trust in reference to integrated circuits addresses the concern that the design and/or fabrication of the integrated circuit (IC) may be purposely altered by an adversary. The insertion of a hardware Trojan involves a deliberate and malicious change to ...
Detecting Trojans through leakage current analysis using multiple supply pad IDDQS
Hardware Trojans have emerged as a new threat to the security and trust of computing systems. Hardware Trojans are deliberate and malicious modifications to the logic function implemented within digital and mixed signal chips. In contrast to software ...
Virus Analysis on IDT Hooks of Rootkits Trojan
IEEC '09: Proceedings of the 2009 International Symposium on Information Engineering and Electronic CommerceRootkits Trojan virus, which can control attacked computers, delete import files and even steal password, are much popular now. Interrupt Descriptor Table (IDT) hook is rootkit technology in kernel level of Trojan. The paper makes deeply analysis on the ...
Comments