X-Ray And Optical Profiler Analysis Of Electroformed X-Ray Optics

Yutaka Matsui; Melville P. Ulmer; Peter Z. Takacs

doi:10.1117/12.942163

9 August 1988 X-Ray And Optical Profiler Analysis Of Electroformed X-Ray Optics

Yutaka Matsui, Melville P. Ulmer, Peter Z. Takacs

Proceedings Volume 0830, Grazing Incidence Optics for Astronomical and Laboratory Applications; (1988) https://doi.org/10.1117/12.942163
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

Electroformed grazing incidence mirrors were tested with x rays and were measured with an optical profiler. Their total effective areas are ⪆70% of the theoretical values both for 1.5- and 6.4-keV x rays. The half-power diameters (HPDs) are ⪅2 min of arc at 1.5 keV. Comparing the x-ray test result with the optical measure-ment, we set requirements of high-frequency roughness <14 Å and a midfrequency roughness <70 Å for a HPD < 1.5 min of arc at 7 keV. We also present a design of the mirror array telescope for high energies (MARTHE) which has a total effective area of ~1000 cm2 for 7-keV x rays.

Citation Download Citation

Yutaka Matsui, Melville P. Ulmer, and Peter Z. Takacs "X-Ray And Optical Profiler Analysis Of Electroformed X-Ray Optics", Proc. SPIE 0830, Grazing Incidence Optics for Astronomical and Laboratory Applications, (9 August 1988); https://doi.org/10.1117/12.942163

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