Paper
19 August 2009 Modeling the image distortion of echelle spectrographs with T&P changes
Author Affiliations +
Abstract
Even slight changes of temperature and pressure in high resolution ´Echelle spectrographs affect the spot image on the detector plane. At the same time astronomical applications require a stability of the measurement of up to 1/3000 of a pixel on the CCD (with a typical pixel size being 15μm). With this paper we present a study of the effects of thermal and pressure instabilities on ray tracing models of a typical ´Echelle spectrograph. We conclude the required minimum stabilty in these two parameters to reach the goal of precision spectroscopy.
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Frank Grupp, ShaoMing Hu, and Liang Wang "Modeling the image distortion of echelle spectrographs with T&P changes", Proc. SPIE 7440, Techniques and Instrumentation for Detection of Exoplanets IV, 74401G (19 August 2009); https://doi.org/10.1117/12.825845
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KEYWORDS
Spectrographs

Charge-coupled devices

Dispersion

Temperature metrology

3D modeling

Prisms

Thermal effects

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