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The ORIONTM series of test reticles have been used for many years as the photomask industry standard for evaluating contamination inspection algorithms. The deposition of Polystyrene Latex (PSL) spheres on various reticle pattern
designs allow STARlightTM tool owners to measure the relative contamination inspection performance in a consistent and quantifiable manner. However, with recent inspection technology advances such as shorter laser (light source)
wavelengths and smaller inspection pixels, PSL spheres were observed to physically degrade over relatively short time
periods: especially for the smallest sized spheres used to characterize contamination inspection performance at the most
advanced technology nodes.
Investigations into using alternative materials or methods that address the issue of PSL shrinkage have not yet proven
completely successful. Problems such as failure to properly adhere to reticle surfaces or identification of materials that
can produce consistent and predictable sphere sizes for the reliable manufacture of these critical test masks are only some
of the challenges that must be solved. Even if these and other criteria are met, the final substance must appear to
inspection optics as pseudo soft defects which resemble actual contamination that inevitably appears on production
reticle surfaces.
In the interim, programmed pindot defects present in the quartz region of the SPICATM test reticle are being used to characterize contamination performance while a suitable long-term solution to address the issue of shrinking PSL
spheres on ORION masks can be found. This paper examines the results of a programmed pindot test reticle specifically
designed to evaluate contamination algorithms without the deposition of PSL spheres or similar structures. This
alternative programmed pindot test reticle uses various background patterns similar to the ORION, however, it also
includes multiple defects sizes and locations making it more desirable than the limited range of defects found on the
SPICA.
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