Measurement of Stark parameters of HeII P-Alpha, P-Beta and P-Gamma spectral lines

Santiago Mar; F. Rodriguez; R. J. Pelaez; J. A. Aparicio; V. R. Gonzalez; Juan Antonio del Val

doi:10.1117/12.590856

21 October 2004 Measurement of Stark parameters of HeII P-Alpha, P-Beta and P-Gamma spectral lines

Santiago Mar, F. Rodriguez, R. J. Pelaez, J. A. Aparicio, V. R. Gonzalez, Juan Antonio del Val

Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.590856
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela

Abstract

Optical diagnostics is a known and powerful tool to obtain information concerning the processes involved inside and around plasma. In the case of helium plasmas, they are present in industrial applications, like welding or cutting processes and in scientific research, like the inertial confinement plasmas or astrophysical analysis. This work reports information on the pressure broadened profiles of the HEII Paschen-alpha (Pα), Paschen-beta (Pβ) and Paschen-gamma (Pγ) spectral lines measured in a pulsed discharge lamp. Information relative to the line shapes, full width at 1/2, 1/4 and 1/8 of the maximum intensity and the dip of the HEII 320.3 nm is provided. The electron density has been determined by two-wavelength interferometry and from the Stark width of the HEI 501.6 nm and ranges during the HeII emission from 0.54 to 0.64 10²³ m^-3 in the plasma. Temperature (1.7 - 2.4 eV) has been simultaneously determined from the Boltzmann-plot of HEI and from local thermodynamic equilibrium (LTE) assumptions. The final results have been compared with most of the previous existing data.

Citation Download Citation

Santiago Mar, F. Rodriguez, R. J. Pelaez, J. A. Aparicio, V. R. Gonzalez, and Juan Antonio del Val "Measurement of Stark parameters of HeII P-Alpha, P-Beta and P-Gamma spectral lines", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.590856

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KEYWORDS

Plasma

Protactinium

Interferometry

Helium

Spectroscopy

Temperature metrology

Neon

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