Paper
30 May 2003 System for off-line optical paper inspection and quality control
Hugo A. Navarrete, Cristina Cadevall, Mouade Bouydain, Joan Anto, Josep M. Pladellorens, Josep F. Colom, Agusti Tosas
Author Affiliations +
Abstract
A device has been designed for off-line optical paper inspection and quality control of stripes and holes in the cigarette paper. Hardware description is first presented including main paper characteristics to be measured. Typical paper stripe and holes structures are then discussed with image processing and analysis considerations to discriminate these structures, focusing in the problems derived from the small area of holes and of their internal structure that is analyzed with a confocal microscope. Algorithms for image processing and analysis are described. These algorithms involve equalization, binarization, stripes structure detection, holes distribution and statistics.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hugo A. Navarrete, Cristina Cadevall, Mouade Bouydain, Joan Anto, Josep M. Pladellorens, Josep F. Colom, and Agusti Tosas "System for off-line optical paper inspection and quality control", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.500672
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KEYWORDS
Image analysis

Statistical analysis

Image processing

Control systems

Inspection

Optical inspection

Confocal microscopy

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