Quasi-optical dynamical surface resistance characterization of HTS laser-ablated films

M. Branescu; J. Jaklovsky; Carmen Ristoscu; Ion N. Mihailescu

doi:10.1117/12.478643

9 August 2002 Quasi-optical dynamical surface resistance characterization of HTS laser-ablated films

M. Branescu, J. Jaklovsky, Carmen Ristoscu, Ion N. Mihailescu

Proceedings Volume 4762, ALT'01 International Conference on Advanced Laser Technologies; (2002) https://doi.org/10.1117/12.478643
Event: International Conference on: Advanced Laser Technologies (ALT'01), 2001, Constanta, Romania

Abstract

The paper presents a syntheses of the last data concerning the optimal parameters of the deposition process to obtain the best dynamic quality of HTS thin films in connection with the most precise dynamic measurement method known to date. The paper makes a comparison between the performances achieved by the classical dynamical surface resistance nondestructive measurement techniques of the HTS laser ablated thin films and the quasi- optical high performances one.

Citation Download Citation

M. Branescu, J. Jaklovsky, Carmen Ristoscu, and Ion N. Mihailescu "Quasi-optical dynamical surface resistance characterization of HTS laser-ablated films", Proc. SPIE 4762, ALT'01 International Conference on Advanced Laser Technologies, (9 August 2002); https://doi.org/10.1117/12.478643

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