Continuous-wave CO2-laser-induced damage thresholds in optical components

Keith E. Puttick; Rune Holm; Detlev Ristau; Urs Natzschka; George Kiriakidis; Nirmal Garawal; Eddie Judd; David Holland; David Greening; Nick Ellis; Mark Wilkinson; Miguel Garcia Pamies; Celestino Sanviti

doi:10.1117/12.307045

20 April 1998 Continuous-wave CO2-laser-induced damage thresholds in optical components

Keith E. Puttick, Rune Holm, Detlev Ristau, Urs Natzschka, George Kiriakidis, Nirmal Garawal, Eddie Judd, David Holland, David Greening, Nick Ellis, Mark Wilkinson, Miguel Garcia Pamies, Celestino Sanviti

Author Affiliations +

Proceedings Volume 3244, Laser-Induced Damage in Optical Materials: 1997; (1998) https://doi.org/10.1117/12.307045
Event: Laser-Induced Damage in Optical Materials: 1997, 1997, Boulder, CO, United States

Abstract

The measurement of intrinsic laser induced damage thresholds (LIDT) in optical components for continuous wave (CW) CO₂ radiation has been investigated. A combination of analytical and numerical models showed that the temperature rise is mainly determined by the surface absorption in transmissive as well as reflective components, and is proportional to the ratio of power to linear dimension (P/d) of the irradiated spot rather than to the conventional power/area (P/d²) parameter. The former ratio therefore represents the correct power scaling law for LIDT measurement in CW laser systems. The precise time domain within which this law holds is a function of spot diameter. This prediction has been confirmed by experimental LIDT tests on well characterized uncoated ZnSe substrates and copper mirrors, and on coated ZnSe windows and copper mirrors. Measured P/d values, though lower than predicted by modelling are considerably higher than those inferred from the technical literature, and show that transmissive components may be used at much higher powers than are at present believed. The results indicate that surface absorption occurs primarily in the sub-surface processing layer. This has been shown by transmission electron microscopy and spectroscopic ellipsometry to be a few hundred nm in depth.

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Keith E. Puttick, Rune Holm, Detlev Ristau, Urs Natzschka, George Kiriakidis, Nirmal Garawal, Eddie Judd, David Holland, David Greening, Nick Ellis, Mark Wilkinson, Miguel Garcia Pamies, and Celestino Sanviti "Continuous-wave CO2-laser-induced damage thresholds in optical components", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); https://doi.org/10.1117/12.307045

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