Paper
21 December 2023 Improving Nikon XY-2i performance
Stewart Lyle, Ruben Rodriguez, Patrick M. Troccolo
Author Affiliations +
Abstract
Due to the need for better repeatability in mask registration measurement, Intel Corporation instigated a joint project with Nikon Precision Inc attempting to improve the performance of their new XY-2I to +/- 0.05μ over lOOmn. The empirical experimentation focused on controlling and/or more accurately monitoring the errors associated with interferometer compensation for air and mask temperature, temperature differences between the X and Y portions of the interferometer, plate temperature non-uniformity, and incorrect plate climatization. Flouroptic temperature probes monitoring plate and X/Y interferometer temperatures showed that installation of curtains and precisely-placed fans, better placement of Nikon air and mask temperature sensors, and proper plate climatization eliminated X/Y interferometer temperature differences, improved plate temperature stability and uniformity, and greatly reduced the air and plate temperature measurement errors. Long-term repeatability and residual-orthogonality measurements both showed large improvements with the range of orthogonality fluctuations ^ +/- 0.14” of arc and long-term repeatability ^ +/- 0.06μ over 100mm. These results indicate that with a few simple and inexpensive modifications, XY-2I performance improvement is possible.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stewart Lyle, Ruben Rodriguez, and Patrick M. Troccolo "Improving Nikon XY-2i performance", Proc. SPIE 12810, Bay Area Chrome Users Society Symposium 1986, 1281004 (21 December 2023); https://doi.org/10.1117/12.3011914
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KEYWORDS
Temperature metrology

Beam path

Fluctuations and noise

Interferometers

Air temperature

Climatology

Curtains

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