We design two different Hartmann type null screens based on an exact ray trace for testing a fast plano-convex aspherical condenser. The first null screen is designed for testing the external convex surface or periphery area for the condenser by reflection. We have implemented an exact ray trace assuming a point source placed along the optical axis, emitting a bundle of rays, which are reflected by the surface under test, to obtain a non-uniform array of spots, which are printed on paper sheet and wrapped on a plastic cylinder fabricated by using additive manufacture. Subsequently, by reversibility Principle’s after by reflection we obtain a uniform array pattern displayed at the detection plane. Alternatively, to evaluate the whole area for the condenser, the second null screen is designed for testing the central convex area for the condenser by refraction. Thus, we have implemented an exact ray trace assuming an incident plane wavefront, these rays are refracted through the lens under test, to obtain a non-uniform array of drop spots, which are printed on plastic sheet and placed in front of the lens under test. Finally, assuming the reversibility Principle’s after by refraction we obtain a uniform array pattern displayed at the detection plane. For this method, we have called Hartmann type hybrid null screens.
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