Presentation + Paper
11 August 2023 Synthetically generated microscope images of microtopographies using stable diffusion
Stefan Siemens, Markus Kästner, Eduard Reithmeier
Author Affiliations +
Abstract
This study presents a method to generate synthetic microscopic surface images by adapting the pre-trained latent diffusion model Stable Diffusion and the pre-trained text encoder OpenCLIP-ViT/H. A confocal laser scanning microscope was used to acquire the dataset for transfer learning. The measured samples include metallic surfaces processed with different abrasive machining methods like grinding, polishing, or honing. The network is trained to generate microtopographies with these machining methods, with different materials (for example, aluminum, PVC, and steel) and roughness values (for example, milling with Ra=0.4 to Ra =12.5). The performance of the network is evaluated through visual inspection, and the objective image quality measures Peak Signal-to-Noise Ratio (PSNR), Structural Similarity Index Measure (SSIM), and Frechet Inception Distance (FID). The results demonstrate that the proposed method can generate realistic microtopographies, albeit with some limitations. These limitations may be due to the fact that the original training data for the Stable Diffusion network used mostly images from the Internet, which often show people or landscapes. It was also found that the lack of post-processing of the synthetic images may lead to a reduction in perceived sharpness and less finely detailed structures. Nevertheless, the performance of the model demonstrates a promising and effective approach to surface metrology and materials science, contributing to fields such as materials science and surface engineering.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefan Siemens, Markus Kästner, and Eduard Reithmeier "Synthetically generated microscope images of microtopographies using stable diffusion", Proc. SPIE 12623, Automated Visual Inspection and Machine Vision V, 1262309 (11 August 2023); https://doi.org/10.1117/12.2673643
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KEYWORDS
Image quality

Machine learning

Metrology

Data acquisition

Surface finishing

Confocal laser scanning microscopy

Convolutional neural networks

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