Presentation + Paper
13 June 2023 Optimization of large format CMOS image sensors using contrast detection figure of merit
Jim Janesick, Chris Parks, Judy Zhu, Hung Doan, Jim Andrews, Namwoong Paik, John Tower
Author Affiliations +
Abstract
This paper discusses specific SRI CMOS imagers that use for optimization a relatively new imaging performance parameter called the Contrast Detection Figure of Merit (CDFM). The large backside illuminated (BSI) stitched imagers come in two primary formats: a NMOS 10 um pixel x Mk x Nk imager where M x N are whole numbers and a PMOS 4um quad pixel x 4k x 4k and 8k x 8k. We briefly describe their pixel design and performance in addition to comparing NMOS and PMOS technologies discussing their advantages and disadvantages. Next we describe the CDFM technique where we join TCAD device and Monte Carlo simulations which together produce the modulation transfer function (MTF) and Quantum Efficiency (QE) as a function of photon wavelength, silicon epitaxial (epi) thickness and substrate bias given the pixel size. The two parameters are then multiplied together producing CDFM. The results show that quantum efficiency (QE) and the modulation transfer function (MTF) are competing variables which lead to an optimum epi thickness for maximum CDFM and contrast signal to noise (CSN) performance. The CDFM curves can also be expanded to MTFxQExBB where BB is the working Black Body radiation spectrum (BB) leading us to absolute performance given the strength of incoming radiation as a function of wavelength. Lastly, the paper compares CDFM modeling and testing results using standard measurement techniques (MTF, QE and Photon Transfer).
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jim Janesick, Chris Parks, Judy Zhu, Hung Doan, Jim Andrews, Namwoong Paik, and John Tower "Optimization of large format CMOS image sensors using contrast detection figure of merit", Proc. SPIE 12546, Sensors and Systems for Space Applications XVI, 125460N (13 June 2023); https://doi.org/10.1117/12.2664445
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KEYWORDS
Modulation transfer functions

Quantum efficiency

Electric fields

Silicon

Imaging systems

Reflection

Monte Carlo methods

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