Super-resolved image reconstruction by structured illumination microscopy

Weiyi Xia; Ying Bi; Yu Cao; Kailong Xu; Pengfei Fan

doi:10.1117/12.2642671

5 January 2023 Super-resolved image reconstruction by structured illumination microscopy

Weiyi Xia, Ying Bi, Yu Cao, Kailong Xu, Pengfei Fan

Proceedings Volume PC12316, Advanced Optical Imaging Technologies V; PC123160S (2023) https://doi.org/10.1117/12.2642671
Event: SPIE/COS Photonics Asia, 2022, Online Only

Conference Poster

Abstract

Structured Illumination Microscopy(SIM) is a suitable instrument for fluorescence imaging, especially dynamic imaging of live cells. It has two significant advantages of fast imaging speed and low excitation light energy density, and can reach the resolution of 100nm. In this article, we focus on the traditional reconstruction algorithm of SIM, which separates the spectrum with 9 raw images of 3-step phase-shifted picture in 3 orientations and operates the reconstruction with the correct displacement in Fourier space. However, without considering the initial phase error and the possibility that the displacement is a sub-pixel, there are artifacts in the results of the traditional reconstruction algorithm of SIM. To eliminate the artifacts and improve the imaging quality, we analyze the causes of various artifacts, and study the cross-correlation-based reconstruction algorithm of SIM, using the maximum cross-correlation value between the spectrum to get the correct displacement. Then, we simulate the illumination experimental parameters on the images of the reconstructed results. From the perspective of both hardware and software, we respectively consider the construction of the home-built SIM setup and the reconstruction software design, and finally realize the tri-color SIM system.

Conference Presentation

Citation Download Citation

Weiyi Xia, Ying Bi, Yu Cao, Kailong Xu, and Pengfei Fan "Super-resolved image reconstruction by structured illumination microscopy", Proc. SPIE PC12316, Advanced Optical Imaging Technologies V, PC123160S (5 January 2023); https://doi.org/10.1117/12.2642671

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available