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5 March 2022 Nanophotonics in electromagnetic measurements
Tariq Manzur, Xuejun Lu, Yifei Li, Michael J. Benker, Lucio De Pra
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Proceedings Volume PC12009, Quantum Sensing and Nano Electronics and Photonics XVIII; PC1200903 (2022) https://doi.org/10.1117/12.2601722
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
Nanophotonics can play important roles for next generation electromagnetic measurements and communications. At present, critical Electromagnetic (EM) properties such as radar cross section (RCS) and inverse synthetic aperture radar image (ISAR) are often measured in anechoic chambers. But for very large structures, this could be expensive or impractical due to the sheer size of the structure. Maxwell's equations are invariant under dilatation transformation. It is possible to make the measurement on reduced size models and using proportionally higher frequencies. By conserving the scale factor between model and wavelength, the solution is identical. Thus, using nanophotonics, we create a 3D- printed emulator at the light wavelength for high resolution scaled RCS/ISAR measurements of large complex microwave and millimeter wave EM structures. The RCS and ISAR of the EM structure is consequently measured by an ultra-compact benchtop coherent optical measurement range. In addition, we develop quantum dot coupled active plasmonic nano antenna that can integrate with nano-photonic emulator to study RF antenna propagation inside complex electromagnetic structures.
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Tariq Manzur, Xuejun Lu, Yifei Li, Michael J. Benker, and Lucio De Pra "Nanophotonics in electromagnetic measurements", Proc. SPIE PC12009, Quantum Sensing and Nano Electronics and Photonics XVIII, PC1200903 (5 March 2022); https://doi.org/10.1117/12.2601722
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KEYWORDS
Electromagnetism
Nanophotonics
3D modeling
Extremely high frequency
Maxwell's equations
Microwave radiation
Optical testing
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