Paper
31 December 2020 Characterization of antenna side and back radiation in a multipath site
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Proceedings Volume 11718, Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies X; 117182G (2020) https://doi.org/10.1117/12.2572075
Event: Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies 2020, 2020, Online Only
Abstract
Measuring the radiation characteristics of an antenna is an important step in the design process. In most cases, antennas are used in complex propagation environments, substantially different from the ideal model of the free space, where the presence of obstacles leads to multiple propagation pathways, and in some cases, when the obstacles are very close to the antennas, they become part of the radiating element. However, the characterization of an antenna is usually done in measuring sites with characteristics as close as possible to those of the free space. In most cases, such measurements are performed in an Open Area Test Site location (OATS), cleared enough of obstacles, or in an anechoic chamber. In this paper we investigate the application of the distance averaging method for antenna gain measurements in the side or back direction. The approach was successfully validation through measurements on a log-periodic dipole array (LPDA) in a regular office room.
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Mariana Vasilica Galbiaza, Stefania Bucuci, Liliana Anchidin, and Razvan D. Tamas "Characterization of antenna side and back radiation in a multipath site", Proc. SPIE 11718, Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies X, 117182G (31 December 2020); https://doi.org/10.1117/12.2572075
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KEYWORDS
Antennas

Distance measurement

Calibration

Free space

Wave propagation

Data acquisition

Scattering

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