Low degradation Spectralon selection

Vijay Murgai; Staci Klein; Will Arnold; Chris Durell; Steve Bowers; Brandon Russell; James J. Butler; Xiaoxong Xiong

doi:10.1117/12.2568774

20 August 2020 Low degradation Spectralon selection

Vijay Murgai, Staci Klein, Will Arnold, Chris Durell, Steve Bowers, Brandon Russell, James J. Butler, Xiaoxong Xiong

Proceedings Volume 11501, Earth Observing Systems XXV; 115010X (2020) https://doi.org/10.1117/12.2568774
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

Spectralon® is a high reflectance excellent Lambertian diffuser used to reflect sunlight for use as a calibrator for on-orbit and ground instruments. Radiometric calibration of the reflective bands in the 0.4 to 2.5μm wavelength range is performed by measuring the sunlight reflected from Spectralon® . Reflected sunlight is directly proportional to the Bidirectional Reflectance Distribution Function (BRDF) of the Spectralon® . On-orbit exposure to sunlight results in solarization due to solar UV. Previously, the rate / amount of solarization has varied as observed from on orbit measurements as well as laboratory UV exposure testing of samples. A method for determining whether a particular batch of Spectralon® has low solarization has been developed. This method relies on hemispherical reflectance measurements in the 0.25- 0.5 μm wavelength range before and after Spectralon® bake out. This method is reliable for as-made Spectralon® , not for contamination verification after shipment. We have also determined that additional Spectralon® bake outs do not change the as-made Spectralon® solarization rate. Knowledge of possible Spectralon solarization is important prior to its shipment to customers and eventual deployment in satellite and ground-based instrument calibration.

Conference Presentation

Citation Download Citation

Vijay Murgai, Staci Klein, Will Arnold, Chris Durell, Steve Bowers, Brandon Russell, James J. Butler, and Xiaoxong Xiong "Low degradation Spectralon selection", Proc. SPIE 11501, Earth Observing Systems XXV, 115010X (20 August 2020); https://doi.org/10.1117/12.2568774

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