Test generation of complex digital systems including sequential modules

Zejian Liu; Hua Liu; Tianrong Zhou; Fengyao Hu

doi:10.1117/12.235497

22 March 1996 Test generation of complex digital systems including sequential modules

Zejian Liu, Hua Liu, Tianrong Zhou, Fengyao Hu

Proceedings Volume 2644, Fourth International Conference on Computer-Aided Design and Computer Graphics; (1996) https://doi.org/10.1117/12.235497
Event: Fourth International Conference on Computer-Aided Design and Computer Graphics, 1995, Wuhan, China

Abstract

According to hierarchical design methodology, complex digital systems are composed of a number of modules interconnected by nets. This paper presents a high level test generation which is accomplished in two steps. The first step is the test generation of individual modules in isolation. A graph theoretic approach for generating optimal test sequence for sequential modules is developed. The second step is test generation of these modules in the complex digital system one by one. When one module is under consideration for test generation, the others constitute the signal propagation paths. This task is to transform the module I/O sequence into primary I/O sequence for testing and is performed by the forward and backward evaluation procedures developed in this paper. Besides, to guarantee the completeness of the test, the concise and precise functional models for sequential circuit testing are used.

Citation Download Citation

Zejian Liu, Hua Liu, Tianrong Zhou, and Fengyao Hu "Test generation of complex digital systems including sequential modules", Proc. SPIE 2644, Fourth International Conference on Computer-Aided Design and Computer Graphics, (22 March 1996); https://doi.org/10.1117/12.235497

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