Paper
31 January 2013 Diode lasers for interferometric length measurements
Author Affiliations +
Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87593X (2013) https://doi.org/10.1117/12.2015024
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China
Abstract
An overview is given on investigation activities of author’s researcher groups at the PTB, the National Metrology Institute of Germany, for testing, developing and applying of diode lasers to be used as a light source in interferometry. After a short background about laser emission’s principle and types of diode lasers their spectral properties are described in detail with taking their using in interferometry into account. Then different methods of frequency stabilization of diode lasers are briefly discussed. Lastly several examples for application of diode laser interferometers for length measurements are reported.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ahmed Abou-Zeid "Diode lasers for interferometric length measurements", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87593X (31 January 2013); https://doi.org/10.1117/12.2015024
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KEYWORDS
Semiconductor lasers

Interferometers

Interferometry

Diodes

Laser stabilization

Modulation

Refractive index

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