Glycine phosphite single crystals were grown by employing the slow evaporation solution growth technique. Grown crystals were subjected to shock waves generated by a pressure-driven Reddy Tube. The (001) plane of the grown crystal was subjected to various numbers of shock pulses of Mach number 1.7 whereby its structural, optical, and morphological properties were investigated by using the powder X-ray diffractometer, ultraviolet (UV)-visible spectrometer, impedance analyzer, and optical microscope, respectively. The powder X-ray diffraction analysis confirms that the crystals have comparatively higher structural stability along the (001) direction. The observed UV-visible spectrum reveals a considerable increase in optical transmission when increasing the number of shock pulses. The band gap of the crystal is also found to have increased from 4.15 to 4.17 eV after the fifth shock-loaded condition. The dielectric behaviour of the crystal under shocked conditions is studied in the frequency range of 1 Hz to 1 MHz.