18 March 2022 Deeper feature integration network for salient object detection of strip steel surface defects
Bin Wan, Xiaofei Zhou, Bolun Zheng, Yaoqi Sun, Jiyong Zhang, Chenggang Yan
Author Affiliations +
Abstract

With the development of productivity, people set higher demands on the quality of steel. In recent years, artificial intelligence, especially deep learning-based computer vision technology has attracted great attention, which can be used for detecting steel surface defects such as scratches, patches, and rust spots. However, due to the complexity of the strip steel surface, it is still a challenge to accurately and effectively detect defect regions by the existing defects detection methods. Therefore, we propose a unique saliency model, i.e., deeper feature integration network to highlight the defect regions on the strip steel surface. To be specific, after each encoder stage, we introduce the multiscale global feature extraction module to elevate the multiscale deep features from the encoder. Meanwhile, we deploy the deeper feature extraction module, which contains a bidirectional feature extraction unit, to dig the effective representation for defects. Particularly, the forward one is equipped with a channel-space weighted module and the backward one is equipped with a split attention module. After that, the features from the two branches are progressively integrated by the decoder, yielding the final high-quality saliency maps that give a good depiction of the strip steel surface defects. Extensive experiments are executed on the public dataset, and the comparison results show that our model performs better than the 15 state-of-the-art methods, which proves the effectiveness and superiority of the proposed model.

© 2022 SPIE and IS&T 1017-9909/2022/$28.00 © 2022 SPIE and IS&T
Bin Wan, Xiaofei Zhou, Bolun Zheng, Yaoqi Sun, Jiyong Zhang, and Chenggang Yan "Deeper feature integration network for salient object detection of strip steel surface defects," Journal of Electronic Imaging 31(2), 023013 (18 March 2022). https://doi.org/10.1117/1.JEI.31.2.023013
Received: 29 September 2021; Accepted: 2 March 2022; Published: 18 March 2022
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Feature extraction

Computer programming

Defect detection

Performance modeling

Data modeling

Fermium

Frequency modulation

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