Single-crystal data collection with a Laue diffractometer

The Laue technique is suitable to study effects that depend on wavelength such as absorption, anomalous dispersion or secondary extinction. The accuracy of the measured integrated intensities for X-ray structure determination is comparable with measurements of conventionally collected data. The present paper describes and discusses the results of a single-crystal data collection with a Laue diffractometer. The results obtained from the Laue data are in very good agreement with the results from conventionally collected data.