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Precision determination of h/e2 and the fine-structure constant from magneto-transport measurements on 2D electronic systems

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Application of High Magnetic Fields in Semiconductor Physics

Part of the book series: Lecture Notes in Physics ((LNP,volume 177))

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References

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Author information

Authors and Affiliations

  1. Physik-Department, Technische Universität München, D-8046, Garching, Germany

    K. v. Klitzing, B. Tausendfreund, H. Obloh & T. Herzog

Authors
  1. K. v. Klitzing
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  2. B. Tausendfreund
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  3. H. Obloh
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  4. T. Herzog
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Editor information

G. Landwehr

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© 1983 Springer-Verlag

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v. Klitzing, K., Tausendfreund, B., Obloh, H., Herzog, T. (1983). Precision determination of h/e2 and the fine-structure constant from magneto-transport measurements on 2D electronic systems. In: Landwehr, G. (eds) Application of High Magnetic Fields in Semiconductor Physics. Lecture Notes in Physics, vol 177. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-11996-5_1

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  • DOI: https://doi.org/10.1007/3-540-11996-5_1

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-11996-8

  • Online ISBN: 978-3-540-39472-3

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