Authors:	Lidig, Christian Minár, Jan Braun, Jürgen Ebert, Hubert Gloskovskii, Andrei Krieger, Jonas A. Strocov, Vladimir Kläui, Mathias Jourdan, Martin
Title:	Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Online publication date:	20-Aug-2019
Year of first publication:	2019
Language:	english
Abstract:	Heusler compounds are promising materials for spintronics with adjustable electronic properties including 100% spin polarization at the Fermi energy. We investigate the electronic states of AlOx capped epitaxial thin films of the ferromagnetic half-metal Co2MnSi ex situ by soft x-ray angular resolved photoemission spectroscopy (SX-ARPES). Good agreement between the experimental SX-ARPES results and photoemission calculations including surface effects was obtained. In particular, we observed in line with our calculations a large photoemission intensity at the center of the Brillouin zone, which does not originate from bulk states, but from a surface resonance. This provides strong evidence for the validity of the previously proposed model based on this resonance, which was applied to explain the huge spin polarization of Co2MnSi observed by angular-integrating UV-photoemission spectroscopy.
DDC:	530 Physik 530 Physics
Institution:	Johannes Gutenberg-Universität Mainz
Department:	FB 08 Physik, Mathematik u. Informatik
Place:	Mainz
ROR:	https://ror.org/023b0x485
DOI:	http://doi.org/10.25358/openscience-196
URN:	urn:nbn:de:hebis:77-publ-591915
Version:	Accepted version
Publication type:	Zeitschriftenaufsatz
License:	In Copyright
Information on rights of use:	https://rightsstatements.org/vocab/InC/1.0/
Journal:	Physical review : B 99 17
Pages or article number:	Art. 174432
Publisher:	APS
Publisher place:	College Park, Md.
Issue date:	2019
ISSN:	2469-9950 1098-0121
Publisher URL:	http://dx.doi.org/10.1103/PhysRevB.99.174432
Publisher DOI:	10.1103/PhysRevB.99.174432
Appears in collections:	JGU-Publikationen