Title: Recent advances in dual mode charge compensation for XPS analysis

Citation
Morgan DJ, Edwards LE (2019). Recent advances in dual mode charge compensation for XPS analysis. Cardiff University. https://doi.org/10.17035/d.2019.0069433902

Dataset Details

Publisher: Cardiff University

Date (year) of data becoming publicly available: 2019

Data format: .opju

Software Required: Origin or Origin Pro v9 or above or the free Origin Viewer v9.6 or above

Estimated total storage size of dataset: Less than 100 megabytes

Number of Files In Dataset: 1

DOI : 10.17035/d.2019.0069433902

DOI URL: http://doi.org/10.17035/d.2019.0069433902

Description

Dual mode charge compensation has been used successfully for many years to enable X-ray photoelectron spectroscopy (XPS) analysis of a variety of insulating samples. This approach uses a combination of low energy electrons and argon to compensate for positive charge build-up during irradiation by X-rays. While this method works with no detectable side effects in most cases, it was recently reported that the chemical bonding states of some Cr(VI) oxides may be modified by prolonged exposure to the flood source. In this work we demonstrate successful dual mode charge compensation of CrO₃ with no discernible sample modification from the flood source. Under the same flood source conditions, we extend the analysis to other systems known to undergo reduction and present charge compensated XPS data for V₂O₅ and a copper-based metal-organic framework (MOF) showing little or no modification from the flood source, even with prolonged exposure. Data relevant to the publication is provided as transmission corrected XPS data self-contained within an Origin Pro Workbook.

Research results based upon these data are published at https://doi.org/10.1002/sia.6680