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A Comparative Study on Misorientations to Determine the Extent of Recrystallization in Pure ETP Copper

  • STRUCTURE, PHASE TRANSFORMATIONS, AND DIFFUSION
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Abstract

In electron backscatter diffraction (EBSD), kernel average misorientation (KAM), grain average misorientation (GAM), and grain orientation spread (GOS) are considered as the reflection of the extent of recrystallization. This work presents a comparative study of KAM, GAM, and GOS to bring out the best-suited parameter to determine the extent of recrystallization in pure copper. The pure ETP (electrolytic tough pitch) copper samples were characterized through EBSD at three different states: (i) deformed (ii) partially recrystallized and (iii) fully recrystallized. The result shows that the GOS found to be dominating over KAM and GAM in distinguishing the strain-free and deformed grains for pure ETP copper. The cut-off point for delineating the deformed and the strain-free grains has also been determined and applied to low percentage deformation study where higher mechanical strength and electrical conductivity is achieved than the as-received sample.

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ACKNOWLEDGMENTS

We thank Crompton Greaves Company (CG)TM for supplying the ETP copper samples and Dr. JanamejayNemade, formerly (CG)TM for discussions. The EBSD was done at OIM-a DST-IRPHA facility, IIT Bombay.

Funding

We thank Crompton Greaves Company (CG)TM for funding this project.

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Authors and Affiliations

  1. Department of Mechanical Engineering, SRM Institute of Science and Technology, Kattankulathur, Chengalpattu, Tamil Nadu, India

    N. Harshavardhana & S. P. Sundar Singh Sivam

  2. Department of Mechanical Engineering, Birla Institute of Technology and Science, Pilani-Dubai Campus, Dubai, UAE

    Gulshan Kumar

  3. Center for Innovative Manufacturing Research, School of Mechanical Engineering, VIT, 632014, Vellore, Tamil Nadu, India

    Ashish Kumar Saxena

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  1. N. Harshavardhana
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  2. S. P. Sundar Singh Sivam
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  3. Gulshan Kumar
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Correspondence to N. Harshavardhana.

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Harshavardhana, N., Sivam, S.P., Kumar, G. et al. A Comparative Study on Misorientations to Determine the Extent of Recrystallization in Pure ETP Copper. Phys. Metals Metallogr. 122, 1279–1287 (2021). https://doi.org/10.1134/S0031918X20140094

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