An electronic speckle pattern interferometry in-plane system applied to the evaluation of mechanical characteristics of masonry

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Published under licence by IOP Publishing Ltd
, , Citation M Facchini and P Zanetta 1995 Meas. Sci. Technol. 6 1260 DOI 10.1088/0957-0233/6/9/005

0957-0233/6/9/1260

Abstract

Electronic speckle pattern interferometry (ESPI) can be a powerful tool for efficient non-destructive testing and evaluation of micro-deformations of materials and structures. Unlike traditional transducers, ESPI requires no direct contact with the inspected object and the full-field visualization provides better understanding of the surface behaviour. The authors describe an in-plane deformation inspection system, which offers automatic acquisitions of interferograms at different stages of a test. The system is applied to the evaluation of some mechanical characteristics of masonry components. Qualitative and quantitative results are obtained and a comparison with traditional inspection methods is presented.

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10.1088/0957-0233/6/9/005