Abstract
Space-resolved vacuum ultraviolet (VUV) spectroscopy using a 3-m normal incidence spectrometer is utilized to measure the impurity emission profile in the edge and divertor plasmas of the Large Helical Device (LHD). It measures the vertical profile of VUV lines emitted in the wavelength range of 300–3200 °A. CII, CIII, CIV, and CV lines emitted from carbon ions are successfully measured, and their ion temperatures are derived from the Doppler broadening. Vertical profiles of the emission intensity and the ion temperature are measured simultaneously for the CIV line. The emission intensity profile, which has several peak structures, is reasonably explained by considering the relation between the C3+ ion distribution and the geometry used for the observations.
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Oishi, T., Morita, S., Dong, C. et al. Ion temperature and radial profile of CII-CV located in the edge and divertor plasmas of large helical device. Journal of the Korean Physical Society 64, 840–843 (2014). https://doi.org/10.3938/jkps.64.840
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DOI: https://doi.org/10.3938/jkps.64.840