This study was aimed to examine the dynamic response of drop test in view of some electrical components. The mouse was taken as the model in order to probe into the factors of structural displacement and stress response changes. This research consists of four sections as follows. First, according to the reviewed references, a simple simulate model was developed and studied by using static simulation to confirm the element sizes and parameters. The resulting strain-time graphs of simulate were compared with interval high-speed snapped photographs and those strain-time graphs of the reviewed drop test references, resulting in similar trend and outcome. Second, in an attempt to investigate the impact situation among the PCB board of the drop platform assembled components, four factors with three levels of Taguchi method was designed for exploring the importance of position differences within the structure. The restrain method within the structure was regarded as the main factor of structural displacement and stress response changes in this study. Third, similar restrain method was applied to the mouse structure, the result of which showed that the longest displacement occurred in the design of four screwed corners and two restrained ribbed sides, while the shortest displacement took place in the ribbed design. Finally, the findings of this study also showed that the ribbed design of the mouse would result in the shortest displacement and the least stress response changes; therefore, the mouse structure was apt to be maintained without possible fracture.