International Journal of
Physical Sciences

  • Abbreviation: Int. J. Phys. Sci.
  • Language: English
  • ISSN: 1992-1950
  • DOI: 10.5897/IJPS
  • Start Year: 2006
  • Published Articles: 2569

Full Length Research Paper

Optical and structural properties of lead sulphide (PbS) thin films synthesized by chemical method

B. A. Ezekoye
  • B. A. Ezekoye
  • Crystal Growth and Characterization Laboratory, Department of Physics and Astronomy, University of Nigeria, Nsukka, Enugu State, Nigeria.
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T. M. Emeakaroha
  • T. M. Emeakaroha
  • Crystal Growth and Characterization Laboratory, Department of Physics and Astronomy, University of Nigeria, Nsukka, Enugu State, Nigeria.
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V. A. Ezekoye
  • V. A. Ezekoye
  • Crystal Growth and Characterization Laboratory, Department of Physics and Astronomy, University of Nigeria, Nsukka, Enugu State, Nigeria.
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K. O. Ighodalo
  • K. O. Ighodalo
  • Crystal Growth and Characterization Laboratory, Department of Physics and Astronomy, University of Nigeria, Nsukka, Enugu State, Nigeria.
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P. O. Offor
  • P. O. Offor
  • Department of metallurgical and materials engineering, University of Nigeria.
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  •  Received: 21 April 2015
  •  Accepted: 15 June 2015
  •  Published: 16 July 2015

Abstract

The influence of dip times on the lead sulphide (PbS) thin films deposited on glass slide substrates via chemical bath deposition (CBD) technique using chemical precursors, nitrate, and thiourea, ) in alkaline medium at 300 K was investigated. The optical, structural and morphological studies were performed by UV-vis spectophotometry, X-ray diffraction (XRD) and scanning electron microscopy (SEM) respectively. The XRD showed films of cubic (galena), crystalline in nature with the preferential (111) orientation. The optical studies showed films of direct band gaps in the range of 1.59-1.65 eV.
 
Key words: Lead sulphide, thin films, lead sulphide (PbS), X-Ray diffraction, scanning electron microscope (SEM), bandgap.