Gettering of Transition Metals in Multicrystalline Silicon for Photovoltaic Applications
p.165
p.165
Gettering of Au in Heat Treated Si/SiGe/Si Structures
p.171
p.171
Gettering of Low Concentration Copper, Nickel and Iron Contamination in Czochralski Silicon Wafers
p.177
p.177
Defect Engineering for Silicon-on-Insulator, MeV Implantation and Low Temperature Processing
p.183
p.183
Interactions between Dopants and End-of-Range Defects in Silicon
p.195
p.195
Behaviour of the Size Distribution Function of End-of-Range Dislocation Loops during Silicon Oxidation
p.205
p.205
SiC Buried Layer Formation Induced by Ion Implantation
p.211
p.211
The Mechanisms and Application of Dislocation Related Radiation for Silicon Based Light Sources
p.217
p.217
Critical Conditions for the Generation of the Misfit Dislocations during the Boron Diffusion in Silicon: Analytical Evaluation
p.223
p.223
Interactions between Dopants and End-of-Range Defects in Silicon
Abstract:
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Info:
Periodical:
Solid State Phenomena (Volumes 47-48)
Pages:
195-204
Citation:
Online since:
July 1995
Authors:
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